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1

Verifying Parallel Code After Refactoring Using Equivalence Checking

Abadi, Moria, Keidar-Barner, Sharon, Pidan, Dmitry, Veksler, Tatyana

Journal:

International Journal of Parallel Programming

Year:

2018

Language:

english

File:

PDF, 1.08 MB

english, 2018

2

Universal compact model for long- and short-channel Thin-Film Transistors

Benjamin Iñiguez, Rodrigo Picos, Dmitry Veksler, A. Koudymov, Michael S. Shur, Trond Ytterdal, Warren Jackson

Journal:

Solid-State Electronics

Year:

2008

Language:

english

File:

PDF, 276 KB

english, 2008

3

Interface trap density and mobility extraction in InGaAs buried quantum well metal-oxide-semiconductor field-effect-transistors by gated Hall method

Chidambaram, Thenappan, Veksler, Dmitry, Madisetti, Shailesh, Greene, Andrew, Yakimov, Michael, Tokranov, Vadim, Hill, Richard, Oktyabrsky, Serge

Journal:

Applied Physics Letters

Year:

2014

Language:

english

File:

PDF, 1.32 MB

english, 2014

4

Experimental study of trace element distribution between calcite, fluorite and carbonatitic melt in the system CaCO3 + CaF2 + Na2CO3 ± Ca3(PO4)2 at 100 MPa

Chebotarev, Dmitry A., Veksler, Ilya V., Wohlgemuth-Ueberwasser, Cora, Doroshkevich, Anna G., Koch-Müller, Monika

Journal:

Contributions to Mineralogy and Petrology

Year:

2019

Language:

english

File:

PDF, 1.57 MB

english, 2019

5

ChemInform Abstract: New Metallocenes of Early Transition Metals with Functional Groups in Organic Ligands. Redox Transformations

Dmitrii P. Krut'ko, Maxim V. Borzov, Edward N. Veksler, Roman S. Kirsanov, Andrej V. Churakov, Dmitri A. Lemenovskii

Journal:

Year:

2001

File:

PDF, 26 KB

2001

6

Measurement of the optical absorption spectra of epitaxial graphene from terahertz to visible

Dawlaty, Jahan M., Shivaraman, Shriram, Strait, Jared, George, Paul, Chandrashekhar, Mvs, Rana, Farhan, Spencer, Michael G., Veksler, Dmitry, Chen, Yunqing

Journal:

Applied Physics Letters

Year:

2008

Language:

english

File:

PDF, 437 KB

english, 2008

7

SPIE Proceedings [SPIE Defense and Security - Orlando, FL (Monday 12 April 2004)] Terahertz for Military and Security Applications II - Spectroscopic characterization of explosives in the far-infrared region

Chen, Yunqing, Liu, Haibo, Deng, Yanqing, Veksler, Dmitry B., Shur, Michael S., Zhang, Xi-Cheng, Schauki, Dunja, Fitch, Michael J., Osiander, Robert, Dodson, Caroline, Spicer, James B., Hwu, R. Jennif

Year:

2004

Language:

english

File:

PDF, 97 KB

english, 2004

8

SIMULATIONS OF FIELD-PLATED AND RECESSED GATE GALLIUM NITRIDE-BASED HETEROJUNCTION FIELD-EFFECT TRANSISTORS

Turin, Valentin O., Shur, Michael S., Veksler, Dmitry B.

Journal:

International Journal of High Speed Electronics and Systems

Year:

2007

Language:

english

File:

PDF, 619 KB

english, 2007

9

[IEEE 2013 71st Annual Device Research Conference (DRC) - Notre Dame, IN, USA (2013.06.23-2013.06.26)] 71st Device Research Conference - Quantification of interface trap density above threshold voltage by gated hall method in InGaAs buried quantum well MOSFET

Chidambaram, Thenappan, Madisetti, Shailesh, Greene, Andrew, Yakimov, Michael, Tokranov, Vadim, Veksler, Dmitry, Hill, Richard, Oktyabrsky, Serge

Year:

2013

Language:

english

File:

PDF, 288 KB

english, 2013

10

Modeling Illumination Effects on n- and p-Type InGaAs MOS at Room and Low Temperatures

Han-Ping Chen,, Veksler, Dmitry, Bersuker, Gennadi, Yuan Taur,

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.30 MB

english, 2014

11

Analysis of Charge-Pumping Data for Identification of Dielectric Defects

Veksler, Dmitry, Bersuker, Gennadi, Koudymov, Alexey, Liehr, Maximilian

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 934 KB

english, 2013

12

Gate dielectric degradation: Pre-existing vs. generated defects

Veksler, Dmitry, Bersuker, Gennadi

Journal:

Journal of Applied Physics

Year:

2014

Language:

english

File:

PDF, 1.93 MB

english, 2014

13

[IEEE 2008 IEEE Frontiers in Education Conference (FIE) - Saratoga Springs, NY, USA (2008.10.22-2008.10.25)] 2008 38th Annual Frontiers in Education Conference - Work in progress - remote experimentation lab for students with learning disabilities

Chivukula, Venkata S., Veksler, Dmitry, Shur, Michael S.

Year:

2008

Language:

english

File:

PDF, 419 KB

english, 2008

14

[IEEE 2009 IEEE MTT-S International Microwave Symposium Digest (MTT) - Boston, MA, USA (2009.06.7-2009.06.12)] 2009 IEEE MTT-S International Microwave Symposium Digest - Enhanced terahertz detection using multiple GaAs HEMTs connected in series

Elkhatib, Tamer A., Veksler, Dmitry B., Salama, Khaled N., Zhang, Xi-C., Shur, Michael S.

Year:

2009

Language:

english

File:

PDF, 306 KB

english, 2009

15

Engineering Barrier and Buffer Layers in InGaAs Quantum-Well MOSFETs

Morassi, Luca, Verzellesi, Giovanni, Zhao, Han, Lee, Jack C., Veksler, Dmitry, Bersuker, Gennadi

Journal:

IEEE Transactions on Electron Devices

Year:

2012

Language:

english

File:

PDF, 210 KB

english, 2012

16

Generation-recombination noise in forward biased 4H-SiC p-n diodes

Rumyantsev, Sergey L., Dmitriev, Alexander P., Levinshtein, Michael E., Veksler, Dmitry, Shur, Michael S., Palmour, John W., Das, Mrinal K., Hull, Brett A.

Journal:

Journal of Applied Physics

Year:

2006

Language:

english

File:

PDF, 381 KB

english, 2006

17

[IEEE 2007 IEEE Sensors - Atlanta, GA, USA (2007.10.28-2007.10.31)] 2007 IEEE Sensors - Resonant Detection and Modulation of Terahertz Radiation by 2DEG Plasmons in GaN Grating-Gate Structures

Pala, Nezih, Veksler, Dmitry, Muravjov, Andrey, Stillman, William, Gaska, Remis, Shur, M. S.

Year:

2007

Language:

english

File:

PDF, 294 KB

english, 2007

18

[IEEE 2007 IEEE Sensors - Atlanta, GA, USA (2007.10.28-2007.10.31)] 2007 IEEE Sensors - Detection and Homodyne Mixing of Terahertz Gas Laser Radiation by Submicron GaAs/AlGaAs FETs

Veksler, Dmitry, Muravjov, Andrey, Stillman, William, Pala, Nezih, Shur, Michael

Year:

2007

Language:

english

File:

PDF, 251 KB

english, 2007

19

[IEEE 2007 International Semiconductor Device Research Symposium - College Park, MD, USA (2007.12.12-2007.12.14)] 2007 International Semiconductor Device Research Symposium - Tunable Optically pumped high power terahertz laser on cyclotron resonance in semiconductors

Veksler, Dmitry, Muraviev, Andrei, Shastin, Valery N., Shur, Michael

Year:

2007

Language:

english

File:

PDF, 226 KB

english, 2007

20

NUMERICAL INVESTIGATION OF THE EFFECT OF DOPING PROFILES ON THE HIGH FREQUENCY PERFORMANCE OF InP/InGaAs SUPER SCALED HBTs

VEKSLER, DMITRY, SHUR, MICHAEL S., HOUTSMA, V. E., WEIMANN, N. G., CHEN, Y. K.

Journal:

International Journal of High Speed Electronics and Systems

Year:

2004

Language:

english

File:

PDF, 524 KB

english, 2004

21

ECS Transactions [ECS 219th ECS Meeting - Montreal, QC, Canada (May 1 - May 6, 2011)] - Electron Scattering in Buried InGaAs/High-k MOS Channels

Oktyabrsky, Serge, Veksler, Dmitry, Nagaiah, Padmaja, Chidambaram, Thenappan, Tokranov, Vadim, Yakimov, Michael, Kambhampati, Rama, Chen, Y.-T., Bersuker, Gennadi, Goel, Niti, Hobbs, Chris

Year:

2011

Language:

english

File:

PDF, 1021 KB

english, 2011

22

A New Physical Method Based on $CV$ – $GV$ Simulations for the Characterization of the Interfacial and Bulk Defect Density in High- $k$ /III-V MOSFETs

Sereni, Gabriele, Vandelli, Luca, Veksler, Dmitry, Larcher, Luca

Journal:

IEEE Transactions on Electron Devices

Year:

2015

Language:

english

File:

PDF, 1.55 MB

english, 2015

23

A Unified Two-Band Model for Oxide Traps and Interface States in MOS Capacitors

Taur, Yuan, Chen, Han-Ping, Xie, Qian, Ahn, Jaesoo, McIntyre, Paul C., Lin, Dennis, Vais, Abhitosh, Veksler, Dmitry

Journal:

IEEE Transactions on Electron Devices

Year:

2015

Language:

english

File:

PDF, 2.82 MB

english, 2015

24

Impact of H2 High-Pressure Annealing Onto InGaAs Quantum-Well Metal–Oxide–Semiconductor Field-Effect Transistors With Al2O3/HfO2 Gate-Stack

Tae-Woo Kim,, Hyuk-Min Kwon,, Seung Heon Shin,, Chan-Soo Shin,, Won-Kyu Park,, Chiu, Eddie, Rivera, Manny, Lew, Jae Ik, Veksler, Dmitry, Orzali, Tommaso, Dae-Hyun Kim,

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 807 KB

english, 2015

25

SPIE Proceedings [SPIE Industrial Lasers and Inspection (EUROPTO Series) - Munich, Germany (Monday 14 June 1999)] Terahertz Spectroscopy and Applications II - Cyclotron resonance of two-dimensional holes in strained multi-quantum-well Ge/GeSi heterostructures

Aleshkin, Vladimir Y., Vaks, Vladimir L., Veksler, Dmitry B., Gavrilenko, Vladimir I., Erofeeva, Irina V., Kuznetsov, Oleg A., Moldavskaya, Mariya D., Chamberlain, J. Martyn

Year:

1999

Language:

english

File:

PDF, 263 KB

english, 1999

26

SPIE Proceedings [SPIE SPIE Fourth International Symposium on Fluctuations and Noise - Florence, Italy (Sunday 20 May 2007)] Noise and Fluctuations in Circuits, Devices, and Materials - Generation-recombination noise in forward-biased 4H-SiC p-n diode

Rumyantsev, Sergey L., Macucci, Massimo, Vandamme, Lode K., Dmitriev, Alexander, Levinshtein, Michael, Ciofi, Carmine, Weissman, Michael B., Veksler, Dmitri, Shur, Michael S., Palmour, John, Das, Mrin

Year:

2007

Language:

english

File:

PDF, 338 KB

english, 2007

27

SPIE Proceedings [SPIE Industrial Lasers and Inspection (EUROPTO Series) - Munich, Germany (Monday 14 June 1999)] Terahertz Spectroscopy and Applications II - Cyclotron resonance light holes amplification in optically pumped semiconductors

Veksler, Dmitry B., Muravjov, Andrei V., Shastin, Valery N., Chamberlain, J. Martyn

Year:

1999

Language:

english

File:

PDF, 263 KB

english, 1999

28

New metallocenes of early transition metals with functional groups in organic ligands. Red-ox transformations

Krut'ko, Dmitrii P., Borzov, Maxim V., Veksler, Edward N., Kirsanov, Roman S., Churakov, Andrej V., Lemenovskii, Dmitri A.

Journal:

Pure & Applied Chemistry

Year:

2001

Language:

english

File:

PDF, 77 KB

english, 2001

29

InGaAs Inversion Layer Mobility and Interface Trap Density from Gated Hall Measurements

Chidambaram, T., Veksler, Dmitry, Madisetti, Shailesh, Yakimov, Michael, Tokranov, Vadim, Oktyabrsky, Serge

Journal:

IEEE Electron Device Letters

Year:

2016

Language:

english

File:

PDF, 605 KB

english, 2016

30

Characteristics of Resistive Memory Read Fluctuations in Endurance Cycling

Nminibapiel, David M., Veksler, Dmitry, Shrestha, Pragya R., Kim, Ji-Hong, Campbell, Jason P., Ryan, Jason T., Baumgart, Helmut, Cheung, Kin P.

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 920 KB

english, 2017

31

Pulsed I-V on TFETs: Modeling and Measurements

Smets, Quentin, Verhulst, Anne, Kim, Ji-Hong, Campbell, Jason P., Nminibapiel, David, Veksler, Dmitry, Shrestha, Pragya, Pandey, Rahul, Simoen, Eddy, Gundlach, David, Richter, Curt, Cheung, Kin P., Da

Journal:

IEEE Transactions on Electron Devices

Year:

2017

Language:

english

File:

PDF, 2.38 MB

english, 2017

32

(Invited) Devices in Advanced Technology Nodes: Application-Specific Characterization

Bersuker, Gennadi, Pierce, Donald G., Veksler, Dmitry, Mason, Maribeth S.

Journal:

ECS Transactions

Year:

2017

Language:

english

File:

PDF, 918 KB

english, 2017

33

Comprehensive Capacitance-Voltage Simulation and Extraction Tool Including Quantum Effects for High-k on SiₓGe₁₋ₓ and InₓGa₁₋ₓAs: Part I-Model Description and Validation

Anwar, Sarkar R. M., Vandenberghe, William G., Bersuker, Gennadi, Veksler, Dmitry, Verzellesi, Giovanni, Morassi, Luca, Galatage, Rohit V., Jha, Sumit, Buie, Creighton, Barton, Adam T., Vogel, Eric M.

Journal:

IEEE Transactions on Electron Devices

Year:

2017

Language:

english

File:

PDF, 1.24 MB

english, 2017

34

Comprehensive Capacitance-Voltage Simulation and Extraction Tool Including Quantum Effects for High-k on SiₓGe₁₋ₓ and InₓGa₁₋ₓAs: Part II-Fits and Extraction From Experimental Data

Anwar, Sarkar R. M., Vandenberghe, William G., Bersuker, Gennadi, Veksler, Dmitry, Verzellesi, Giovanni, Morassi, Luca, Galatage, Rohit V., Jha, Sumit, Buie, Creighton, Barton, Adam T., Vogel, Eric M.

Journal:

IEEE Transactions on Electron Devices

Year:

2017

Language:

english

File:

PDF, 732 KB

english, 2017

35

Impact of RRAM Read Fluctuations on the Program-Verify Approach

Nminibapiel, David M., Veksler, Dmitry, Shrestha, Pragya R., Campbell, Jason P., Ryan, Jason T., Baumgart, Helmut, Cheung, Kin P.

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 676 KB

english, 2017

36

Toward reliable RRAM performance: macro- and micro-analysis of operation processes

Bersuker, Gennadi, Veksler, Dmitry, Nminibapiel, David M., Shrestha, Pragya R., Campbell, Jason P., Ryan, Jason T., Baumgart, Helmut, Mason, Maribeth S., Cheung, Kin P.

Journal:

Journal of Computational Electronics

Year:

2017

Language:

english

File:

PDF, 2.01 MB

english, 2017

37

Microwave evaluation of electromigration susceptibility in advanced interconnects

Sunday, Christopher E., Veksler, Dmitry, Cheung, Kin C., Obeng, Yaw S.

Journal:

Journal of Applied Physics

Year:

2017

Language:

english

File:

PDF, 1.45 MB

english, 2017

38

Highly Efficient Rapid Annealing of Thin Polar Polymer Film Ferroelectric Devices at Sub-Glass Transition Temperature

Georgiou, Vasileia, Veksler, Dmitry, Ryan, Jason T., Campbell, Jason P., Shrestha, Pragya R., Ioannou, Dimitris E., Cheung, Kin P.

Journal:

Advanced Functional Materials

Year:

2017

Language:

english

File:

PDF, 910 KB

english, 2017

39

Ferroelectricity in Polar Polymer-Based FETs: A Hysteresis Analysis

Georgiou, Vasileia, Veksler, Dmitry, Campbell, Jason P., Shrestha, Pragya R., Ryan, Jason T., Ioannou, Dimitris E., Cheung, Kin P.

Journal:

Advanced Functional Materials

Year:

2018

Language:

english

File:

PDF, 1.16 MB

english, 2018

40

Analysis and Control of RRAM Overshoot Current

Shrestha, Pragya R., Nminibapiel, David M., Campbell, Jason P., Ryan, Jason T., Veksler, Dmitry, Baumgart, Helmut, Cheung, Kin P.

Journal:

IEEE Transactions on Electron Devices

Year:

2018

Language:

english

File:

PDF, 1.67 MB

english, 2018

41

(Invited) Understanding the Pre-Failure Thermo-Mechanical Issues in Electromigration of TSV Enabled 3D ICs

Sunday, Christopher E, Veksler, Dmitry, Cheung, K. P., Obeng, Yaw S.

Journal:

ECS Transactions

Year:

2017

Language:

english

File:

PDF, 1024 KB

english, 2017

42

Local Field Effect on Charge-Capture/Emission Dynamics

Cheung, Kin P., Veksler, Dmitry, Campbell, Jason P.

Journal:

IEEE Transactions on Electron Devices

Year:

2017

Language:

english

File:

PDF, 1.42 MB

english, 2017

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